{"id":772,"date":"2022-11-10T10:14:22","date_gmt":"2022-11-10T09:14:22","guid":{"rendered":"http:\/\/10.10.12.71\/wordpress\/?page_id=772"},"modified":"2023-03-14T18:11:51","modified_gmt":"2023-03-14T17:11:51","slug":"reference-standards-for-nano-metrology","status":"publish","type":"page","link":"https:\/\/xlith.com\/index.php\/reference-standards-for-nano-metrology\/","title":{"rendered":"Reference Standards for Nano-Metrology"},"content":{"rendered":"\n<p>We produce resolution test patterns, pitch- and linewidth calibration standards for optical inspection systems and scanning electron microscopes.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>We produce resolution test patterns, pitch- and linewidth calibration standards for optical inspection systems and scanning electron microscopes.<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-772","page","type-page","status-publish","hentry","entry"],"_links":{"self":[{"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/pages\/772","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/comments?post=772"}],"version-history":[{"count":1,"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/pages\/772\/revisions"}],"predecessor-version":[{"id":773,"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/pages\/772\/revisions\/773"}],"wp:attachment":[{"href":"https:\/\/xlith.com\/index.php\/wp-json\/wp\/v2\/media?parent=772"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}